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D2 Capacitance-Voltage (C-V Profiling)

Title

Measures the capacitance of a p-n junction or MOS structure as a function of the applied voltage to extract the depth doping profile; directly use the exhaust width of M1.

ID:4513

gphysics.net - Dr. Willy H. Gerber
Palos Verdes, Costa de Corral, Chile