D2.1 Atomic force microscopy (AFM)

Title

Atomic force microscopy is a diagnostic technique aimed at measuring nanometric forces between tip and biological surface.

Its foundation lies in controlled deflection of highly sensitive microcantilevers.

In addition, this discipline deals with local adhesive analysis, which makes it possible to study individual mushrooms.

ID:2578

gphysics.net - Dr. Willy H. Gerber
Palos Verdes, Costa de Corral, Chile